:::

Faculty and staff

:::
Seminar paper
Entry Year97
Paper title (chapter)Test Slice Difference Technique for Low Power Testing
Name of conferenceProc. of IEEE International High Level Design Validation and Test Workshop (HLDVT), Nevada
Conference starting time2008-11-19
Conference closing time2008-11-19
Year of publication2008
sponsorIEEE Computer Society Test Technology Technical Council; the IEEE Computer Society Design Automation
cron web_use_log