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Faculty and staff

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Seminar paper
Entry Year92
Paper title (chapter)Pseudo-Exhaustively Testing VLSI Circuits Using Enhanced Tree-Structured Scan Chains
Name of conference第十四屆超大型積體電路暨計算機輔助設計技術研討會=The 14th VLSI Design/CAD Symposium
Conference starting time2003-08-12
Conference closing time2003-08-15
Year of publication2003
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