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Faculty and staff

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Seminar paper
Entry Year97
Paper title (chapter)An Efficient Test-Data Compaction for Low Power VLSI Testing
Name of conferenceProc. of IEEE Electro/Information Technology Conference (EIT), Ames, Iowa, U.S.A.
Conference starting time2008-05-18
Conference closing time2008-05-18
Year of publication2008
sponsorIowa State University
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