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Faculty and staff

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Seminar paper
Entry Year99
Paper title (chapter)The AB-Filling Methodology for Power-aware At-Speed Scan Testing
Name of conference2010 IEEE International Test Conference(ITC 2010)
Conference starting time2010-10-31
Conference closing time2010-11-05
Year of publication2010
sponsorIEEE Computer Society Test Technology Thchnical Council; IEEE Philadelpjia Section
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